PRODUCT
Simulate pulse interference caused by switch switching, relay bounce, and other factors. Conducted along the power and signal lines to the device, cau
Simulate pulse interference caused by switch switching, relay bounce, and other factors. Conducted along the power and signal lines to the device, cau
EFT/Burst & Surge Immunity Test System integrates Electrical Fast Transient (EFT), Burst and Lightning Surge immunity testing functions into one compact 4U rack-mounted platform. It is designed to simulate transient disturbances caused by switching operations, inductive load interference, lightning surges, and power supply disturbances for EMC immunity verification.
The system supports AC 0–220 V / 16 A and DC 0–110 V / 16 A EUT testing, with EFT output up to 5 kV and surge voltage up to 6 kV / 3 kA. Built-in CDN supports single-phase three-wire and DC testing, providing a complete solution for laboratory EMC compliance testing.
·Integrated design with built‑in EFT‑burst and surge test items
·DUT power capacity: AC 0‑220 V/16 A, DC 0‑110 V/16 A
·EFT‑burst test voltage: 0.2 kV‑5 kV; Surge test voltage: 0.2 kV‑6 kV
·Adopts second‑generation high‑speed semiconductor electronic switch for precise phase control
·Accurate voltage output with smooth waveform
·Built‑in single‑phase three‑wire coupling‑decoupling network
·Real‑time waveform display on screen for each surge interference output (optional)
·Equipped with 10.1‑inch intelligent capacitive touch screen for easy operation
·Surge breakdown‑alarm function supported
·Built‑in standard library
·Supports test report export in Word format
·Abundant program‑controlled interfaces, host‑computer operation available
·Compact size for easy movement
| Parameter | Specification |
| Simulation Item | Electrical Fast Transient (EFT) / Burst & Surge Immunity Test |
| EUT Power Capacity | AC: 0–220 V / 16 A; DC: 0–110 V / 16 A |
| EFT Pulse Voltage | 0.2 kV–5 kV |
| EFT Step Voltage | Freely configurable from 0.1 kV to 2 kV |
| Output Voltage Polarity | Positive, Negative, Positive-then-Negative, Negative-then-Positive |
| Internal Resistance | 50 Ω |
| Frequency Range | 0.1 kHz–1000 kHz |
| Standard Frequency | 5 kHz, 100 kHz |
| Frequency Resolution | 1 Hz |
| Pulse Rise Time | 5 ns |
| Pulse Width (50 Ω) | 50 ns |
| Pulse Width (1 kΩ) | 35 ns–150 ns |
| Number of Pulses per Burst | 1–500 |
| Burst Cycle | 15 ms–60 s |
| Pulse Duration | 10–999999 s |
| IEC Standard | Built-in IEC standards, supporting testing according to standard requirements |
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